![]() ![]() ![]() | CuETP EN: CW004A UNS: C11000 | ![]() |
Cu-ETP, Cu-ETP1
Cupori 110 Premium
C110 - ETP Copper
Cu-ETP-8-CL
KME100
Cu-ETP, Cu-ETP1
CuETP
MB-ETP, MB-ETP1
ASTM B152 Alloy C11000
ETP copper, Cu-a1
Cu-ETP 1
Tough Pitch Copper (ETP)
Cu-ETP
C110
CuETP is the most common copper. It is universal for electrical applications. CuETP has a minimum conductivity rating of 100% IACS and is required to be 99.9% pure. It has 0.02% to 0.04% oxygen content (typical). Most ETP sold today will meet or exceed the 101% IACS specification. As with OF copper, silver (Ag) content is counted as copper (Cu) for purity purposes. C11000C (Electrolytic Tough Pitch Copper) is an electrolytic refined copper widely used for electrical and electronic applications. CuETP has the properties required in all applications with a hydrogen-free atmosphere. In the presence of H2 and heat all oxygen-bearing coppers suffer from so-called hydrogen embrittlement. This is a chemical reduction of copper oxide by diffusing hydrogen leading to formation of H2O within the microstructure, resulting in embrittlement of the grain boundaries. The phosphorus of our copper content is very low, so that electrical conductivity is comparable to the best performing materials. C1100 is an oxygen containing copper which has a very high electrical and thermal conductivity. It has excellent forming properties. Due to its oxygen content soldering and welding properties are limited. The alloy is registered US EPA antimicrobial. Due to its high copper content of about 99% Cu-ETP provides the full antimicrobial properties of copper to inhibit the growth of bacteria, viruses and fungi which are in contact for a short period of time on copper containing surfaces. Traditionally used ETP grade copper for electric applications, characterized by its content of hard copper oxides (Cu2O) with sizes of 5÷10 µm, which, for very small wire diameters, significantly decrease their ductility. Electrolytic Tough Pitch Copper is not suitable for case hardening. This material can be bent, soldered, drilled, riveted, and formed to almost any configuration. ETP Copper is available in round bar, squares, flat rectangular (bus bar), and certain profile shapes.
Literature
Basic properties
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|||||
Density [g/cm3] | Specific heat capacity [J/(kg*K)] | Temperature coefficient of electrical resistance (0...100°C) [10-3/K] | Electrical conductivity [T=20°C, (% IACS)] | Thermal conductivity [W/(m*K)] | Thermal expansion coefficient 20...300°C [10-6/K] |
8,89-8,98 Comments: Solid state, temperature: 20°C 8,32 Comments: Solid state, temperature: 1083°C 7,93 Comments: Liquid state, temperature: 1083°C | 385-386 | 3,7-4,0 | 93,15-100 Comments: min, ASTM | 388 Comments: For high conductivity copper, a values of 387 is an adjusted value corresponding to an electrical conductivity of 101% IACS | 17,7 |
Electrical conductivity is strongly influenced by chemical composition. A high level of cold deformation and small grain size decrease the electrical conductivity moderately. Minimum conductivity level can be specified
Variation of density with amount of cold reduction by rolling for CuETP (C11000) and similar coppers (CuETP1). A - vacuum annealed 12 h at 880 °C and cold drawn; B - vacuum annealed 12 h at 970 °C and flat rolled; C - vacuum annealed 12 h at 995 °C and cold drawn; D - hot rolled, vacuum annealed 4 h at 600 °C and drawn
Theoretical and measured density of ETP copper (density was calculated theoretically and then measured by Archimedes method)
Influence of impurity content on density ETP copper annealed at 700°C, 30min.
Content [%] |
Density [g/cm3] | |
---|---|---|
0,016 O2 |
8,91 |
|
0,04 |
8,90 |
|
0,06 |
8,90 |
|
0,09 |
8,88 |
|
0,27 |
8,84 |
|
0,36 |
8,76 |
|
0,016 O2 |
0,053 As |
8,91 |
0,005 |
0,093 |
8,89 |
0,003 |
0,036 |
8,92 |
0,009 |
0,06 |
8,85 |
0,013 |
0,86 |
8,86 |
0,006 |
1,04 |
8,91 |
0,008 O2 |
0,0035 Sb |
8,91 |
0,013 |
0,021 |
8,91 |
0,005 |
0,046 |
8,90 |
0,015 |
0,042 |
8,92 |
0,016 |
0,22 |
8,92 |
0,014 |
0,47 |
8,90 |
0,015 O2 |
0,002 Bi |
8,90 |
0,016 |
0,006 |
8,92 |
0,015 |
0,015 |
8,98 |
0,014 O2 |
0,06 Fe |
8,90 |
0,003 |
0,20 |
8,92 |
0,004 |
0,40 |
8,92 |
0,008 |
0,73 |
8,91 |
0,005 |
0,96 |
8,91 |
0,004 |
1,32 |
8,91 |
0,007 |
1,80 |
8,91 |
Remarks: Changes in the density of copper were very small for all considered impurities (from 8,76 to 8,98 g/cm3)
Effect of temperature on the density of ETP copper
Temperature [°C] |
Density [g/cm3] |
Reference |
Calculated density * [g/cm3] |
---|---|---|---|
-173 |
9,017 |
||
20 |
8,962 |
|
|
100 |
8,925 |
||
200 |
8,88 |
||
500 |
8,732 |
||
600 |
8,70 |
|
8,656 |
700 |
8,62 |
|
8,605 |
800 |
8,54 |
|
8,554 |
900 |
8,46 |
|
8,506 |
1000 |
8,40 |
|
8,457 |
1083 liquid |
8,00 |
|
|
Volume change on freezing - 4,92% * Calculated according to the formula dt=d20/(1+3αΔt), where α is the coefficient of linear expansion. Underlined density values were used as a basis for calculations. |
Electrical conductivity of CuETP, CuETP1 according to KME
The influence of impurities on the electrical conductivity of CuETP
Electrical resistivity vs strain of Cu-ETP wires in drawn and annealed state
Resistivity measurements for the ETP copper wire before and after annealing at 260°C (Physics Laboratory ENICA, Biskra)
Theoretical and measured values of thermal conductivity of ETP copper at the ambient temperature
Typical uses: produced in all forms except pipe and used for building fronts, downspouts, flashing, gutters, roofing, screening, spouting, gaskets, radiators, busbars, electrical wire, stranded conductors, contacts, radio parts, switches, terminals, ball floats, butts, cotter pins, nails, rivets, soldering copper, tacks, chemical process equipment, kettles, pans, printing rolls, rotating bands, roadbed expansion plates, vats. Automotive industry: radiators, gaskets. Builders hardware: cotter pins, butts, ball floats, tacks, soldering copper, rivets. Consumer: christmas ornaments. Electrical industry: transformer coils, switches, terminals, contacts, radio parts, busbars, terminal connectors, conductors, stranded conductors, cable strip. Fasteners. Industrial: printed circuit boards, stamped parts, pressure vessels, chemical process, equipment, chlorine cells, chimney cap screens, heat exchangers, printing rolls, anodes, rotating bands, pans, vats, heat sinks. Architecture: downspouts, flashing, roofing, gutters, building fronts, skylight frames, kitchen countertops.
Preferred applications: transformer, fuse, relay box, punshed screen, cable strip, current carrying capacity. Literature:
Forms Available: sheet, strip, plate for locomotive fireboxes, rod for locomotive staybolts, flat products, rod, bar and shapes, wire, conductors, tubular products, miscellaneous
CuETP (C11000) | ||
---|---|---|
Product |
Specification |
Literature |
Plate for locomotive fireboxes |
ASME SB11 |
|
Rod |
SAE J463 |
|
MIL-C-12166 |
|
|
Rod for locomotive staybolts |
ASME SB12 |
|
Sheet and strip |
AMS 4500 |
|
Wire |
AMS 4701 |
|
MIL-W-3318 |
|
|
MIL-W-6712 |
|
ASTM and federal specifications for CuETP (C11000)
Product and condition |
Specification number | |
---|---|---|
ASTM |
Federal | |
Flat products: | ||
|
B248 |
- |
|
B152 |
QQ-C-576 |
|
B101 |
- |
|
B370 |
- |
|
B272 |
QQ-C-502 |
|
B451 |
- |
Rod, bar and shapes: | ||
|
B249 |
- |
|
B133 |
QQ-C-502 QQ-C-576 |
|
B49 |
- |
|
B124 |
QQ-C-502 |
|
B187 |
QQ-B-825 |
Wire | ||
|
B250 |
- |
- Tinned |
B1 B246 |
QQ-W-343 - |
- Tinned |
B2 B246 |
QQ-W-343 - |
- Lead alloy coated - Nickiel coated - Rectangular and square - Tinned |
B3 B189 B355 B48 B33 |
QQ-W-343 - - - - |
|
B298 |
- |
|
B47 |
- |
Conductors | ||
|
B174 |
|
|
B8 |
|
|
B286 |
|
|
B172 |
|
|
B229 |
|
Tubular products | ||
|
B188 |
QQ-B-825 |
|
- |
WW-P-377 |
|
B477 |
|
Miscellaneous | ||
|
B224 |
- |
|
B5 |
- |
|
- |
QQ-A-673 |
|
B283 |
- |
EN specification for CuETP (C11000)
Number |
Title - products |
---|---|
EN 13601 |
Copper and copper alloys. Copper rod, bar and wire for general electrical purposes |
EN 13600 |
Copper and copper alloys. Seamless copper tubes for electrical purposes |
EN 13602 |
Copper and copper alloys. Drawn, round copper wire for the manufacture of electrical conductors |
EN 1652 |
Copper and copper alloys. Plate, sheet, strip and circles for general purposes |
EN 1976 |
Copper and copper alloys. Cast unwrought copper products |
EN 1977 |
Copper and copper alloys. Copper drawing stock (wire rod) |
EN 13599 |
Copper and copper alloys. Copper plate, sheet and strip for electrical purposes |
EN 13605 |
Copper and copper alloys. Copper profiles and profiled wire for electrical purposes |
EN 12165 |
Copper and copper alloys. Wrought and unwrought forging stock |
EN 12420 |
Copper and copper alloys. Forgings |
EN 13148 |
Copper and copper alloys. Hot-dip tinned strip |
Chemical composition
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Value | Comments | |
Ag [ wt.% ] | 0,0009 | ||
As [ wt.% ] | 6E-05 | ||
Bi [ wt.% ] | 1E-05 | ||
Cd [ wt.% ] | 1E-06 | ||
Co [ wt.% ] | 3E-06 | ||
Cr [ wt.% ] | 9E-06 | ||
Cu [ wt.% ] | 99,97884 | Calculated | |
Fe [ wt.% ] | 0,00016 | ||
Mn [ wt.% ] | 4E-06 | ||
Ni [ wt.% ] | 0,00017 | ||
O2 [ wt.% ] | 0,019 | ||
P [ wt.% ] | 0,0002 | ||
Pb [ wt.% ] | 7E-05 | ||
S [ wt.% ] | 0,00028 | ||
Sb [ wt.% ] | 6E-05 | ||
Se [ wt.% ] | 1E-05 | ||
Sn [ wt.% ] | 3E-05 | ||
Te [ wt.% ] | 2E-05 | ||
Zn [ wt.% ] | 0,00018 |
* Chemical composition measured for wire rod (diameter 8.00 mm) obtained from Contirod technology
Composition limits: 99.90 Cu min (silver counted as copper). Silver has little effect on mechanical and electrical properties but does raise the recrystallization temperature and tends to produce a fine-grain copper. Iron as present in commercial copper, has no effect on mechanical properties, but even traces of iron can cause C11000 to be slightly ferromagnetic. Sulfur causes spewing and unsoundness, and is kept below 0.003% in ordinary refinery practice. Selenium and tellurium are usually considered undesirable impurities but may be added to improve machinability. Bismuth creates brittleness in amounts greater than 0.001%. Lead should not be present in amounts greater than 0.005% if the copper is to be hot rolled. Cadmium is rarely present; its effect is to toughen copper without much loss in conductivity. Arsenic decreases the conductivity of copper noticeably, although it is often added intentionally to copper not used in electrical service because it increases the toughness and heat resistance of the metal. Antimony is sometimes added to the copper when a high recrystallization temperature is desired
Chemical composition, wt% | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Ag |
As |
Bi |
Cd |
Co |
Cr |
Fe |
Mn |
Ni |
O |
P |
Pb |
S |
Sb |
Se |
Si |
Sn |
Te |
Zn |
Cu |
max. | |||||||||||||||||||
0,00 25
|
0,00 05 1) |
0,00 02 2) |
-1) |
-3) |
-1) |
0,00 10 3) |
-1) |
-3) |
0,04 00 |
-1) |
0,00 05 |
0,00 15 |
0,0004 1) |
0,00 02 2) |
-3) |
-3) |
0,00 02 |
-3) |
- |
1) (As + Cd + Cr + Mn + P + Sb) maximum 0,0015% |
|||||||||||||||||||
2) (Bi + Se + Te) maximum 0,0003%, including (Se + Te) maximum 0,00030% |
|||||||||||||||||||
3) (Co + Fe + Ni + Si + Sn + Zn) maximum 0,0020% |
|||||||||||||||||||
Literature: |
Chemical composition of CuETP according to EN 1976, EN 1977
Chemical composition, wt% | ||||
---|---|---|---|---|
Other named elements |
Cu1) |
Bi |
O |
Pb |
max |
max |
min | ||
(As + Bi + Cd + Co + Cr + Fe + Mn + Ni + O + P + Pb + S + Sb + Se + Si + Sn + Te + Zn) maximum 0,03% |
99,90 |
0,0005 |
0,00402) |
0,005 |
1) Including Ag with maximum 0,015% |
|
|||
2) Maximum permissible oxygen 0,060% |
|
|||
Literature: |
Mechanical properties
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||||||
UTS [MPa] | YS [MPa] | Elongation [%] | Hardness | Young’s modulus [GPa] | Kirchhoff’s modulus [GPa] | Poisson ratio |
220-395 | 69-365 80-120 Comments: Soft Annealed 120-220 Comments: Mechanical hardened | 4-55 | 10-62 Comments: HRB 40-95 Comments: HRF 25-64 Comments: HR30T 48 Comments: HK 47 Comments: HB (99,996 Cu annealed, grain size 0,07mm) | 115 Comments: O60 temper 115-130 Comments: Cold-worked (H) temper 109,46-131 | 44 Comments: O60 temper 44-49 Comments: Cold-worked (H) temper 46 48 48,3 | 0,33 |
Variation of tensile properties with amount of cold reduction by rolling for Cu-ETP (C11000) and similar coppers (Cu-ETP1)
Variation of hardness with amount of cold reduction by rolling for Cu-ETP (C11000) and similar coppers (Cu-ETP1)

Temper |
UTS, MPa |
YS (a), MPa |
Elongation in A50, % |
Hardness |
Shear strength, MPa |
Fatigue strength (b), MPa | |||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
HRF |
HRB |
HR30T | |||||||||||
Flat products, 1 mm thick | |||||||||||||
OS050 |
220 |
69 |
45 |
40 |
- |
- |
150 |
- |
|||||
OS025 |
235 |
76 |
45 |
45 |
- |
- |
160 |
76 |
|||||
H00 |
250 |
195 |
60 |
60 |
10 |
25 |
170 |
- |
|||||
H01 |
260 |
205 |
70 |
70 |
25 |
36 |
170 |
- |
|||||
H02 |
290 |
250 |
84 |
84 |
40 |
50 |
180 |
90 |
|||||
H04 |
345 |
310 |
90 |
90 |
50 |
57 |
195 |
90 |
|||||
H08 |
380 |
345 |
94 |
94 |
60 |
63 |
200 |
97 |
|||||
H10 |
395 |
365 |
95 |
95 |
62 |
64 |
200 |
- |
|||||
H20 |
235 |
69 |
45 |
45 |
- |
- |
160 |
- |
|||||
Flat products, 6 mm thick | |||||||||||||
OS050 |
220 |
69 |
50 |
40 |
- |
- |
150 |
- |
|||||
H00 |
250 |
195 |
40 |
60 |
10 |
- |
170 |
- |
|||||
H01 |
260 |
205 |
35 |
70 |
25 |
- |
170 |
- |
|||||
H04 |
345 |
310 |
12 |
90 |
50 |
- |
195 |
- |
|||||
M20 |
220 |
60 |
50 |
40 |
- |
- |
150 |
- |
|||||
Flat products, 25 mm thick | |||||||||||||
H04 |
310 |
275 |
20 |
85 |
45 |
- |
180 |
- |
|||||
Rod, 6 mm in diameter | |||||||||||||
H80 (40%) |
380 |
345 |
10 |
94 |
60 |
- |
200 |
- |
|||||
Rod, 25 mm in diameter | |||||||||||||
OS050 |
220 |
69 |
55 |
40 |
- |
- |
150 |
- |
|||||
H80 (35%) |
330 |
305 |
16 |
87 |
47 |
- |
185 |
115(c) |
|||||
M20 |
220 |
69 |
55 |
40 |
- |
- |
150 |
- |
|||||
Rod, 50 mm in diameter | |||||||||||||
H80 (16%) |
310 |
275 |
20 |
85 |
45 |
- |
180 |
- |
|||||
Wire, 2 mm in diameter | |||||||||||||
OS050 |
240 |
- |
35(d) |
- |
- |
- |
165 |
- |
|||||
H04 |
280 |
- |
1.5(e) |
- |
- |
- |
200 |
- |
|||||
H08 |
455 |
- |
1.5(e) |
- |
- |
- |
230 |
- |
|||||
Tube, 25 mm outside diameter, 1.65 mm wall thickness | |||||||||||||
OS050 |
220 |
69 |
45 |
40 |
- |
- |
150 |
- |
|||||
OS025 |
235 |
76 |
45 |
45 |
- |
- |
160 |
- |
|||||
H55 (15%) |
275 |
220 |
25 |
77 |
35 |
45 |
180 |
- |
|||||
H80 (40%) |
380 |
345 |
8 |
95 |
60 |
63 |
200 |
- |
|||||
Shapes, 13 mm in diameter | |||||||||||||
OS050 |
220 |
69 |
50 |
40 |
- |
- |
150 |
- |
|||||
H80 (15%) |
275 |
220 |
30 |
- |
35 |
- |
180 |
- |
|||||
M20 |
220 |
69 |
50 |
40 |
- |
- |
150 |
- |
|||||
M30 |
220 |
69 |
50 |
40 |
- |
- |
150 |
- |
|||||
(a) At 0.5% extension under load. (b) At 108 cycles. (c) At 3 × 108 cycles in a rotating beam test. (d) Elongation in 254 mm. (e) Elongation in 1500 mm. |
|||||||||||||
Mechanical properties of CuETP, CuETP1 according to KME
Temper |
UTS, MPa |
YS, MPa |
Elongation A50, % |
Hardness HV |
---|---|---|---|---|
R220 (a) |
220 - 260 |
< 140 |
33 |
40 - 65 |
R240 |
240 - 300 |
≥ 180 |
8 |
65 - 95 |
R290 |
290 - 360 |
≥ 250 |
4 |
90 - 110 |
R360 |
≥ 360 |
≥ 320 |
2 |
≥ 110 |
(a) Annealed |

Metallurgical State D |
Dimensions, mm |
Hardness |
UTS MPa |
YS, MPa |
Elongation | ||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Round, square, hexagonal |
Thickness |
Width |
HB |
HV |
A100 [%] |
A [%] | |||||||||||
From |
up to |
To |
From |
Up to |
To |
From |
Up to |
To |
Min. |
Max. |
Min. |
Max. | |||||
D |
2 |
- |
80 |
0.5 |
- |
40 |
1 |
- |
200 |
Cold drawn product without any specific mechanical properties |
|||||||
H035 (a) |
2 |
- |
80 |
0.5 |
- |
40 |
1 |
- |
200 |
35 |
65 |
35 |
65 |
- |
- |
- |
- |
R200 (a) |
2 |
- |
80 |
1,0 |
- |
40 |
5 |
- |
200 |
- |
- |
- |
- |
200 |
Max.120 |
25 |
35 |
H065 |
2 |
- |
80 |
0,5 |
- |
40 |
1 |
- |
200 |
65 |
90 |
70 |
95 |
- |
- |
- |
- |
R250 |
2 |
- |
10 |
1,0 |
- |
10 |
5 |
- |
200 |
- |
- |
- |
- |
250 |
Min. 200 |
8 |
12 |
R250 |
2 |
10 |
30 |
- |
- |
- |
- |
- |
- |
- |
- |
- |
- |
250 |
Min. 180 |
- |
15 |
R230 |
- |
30 |
80 |
- |
10 |
40 |
- |
10 |
200 |
- |
- |
- |
- |
230 |
Min. 160 |
- |
18 |
H085 |
2 |
- |
40 |
0,5 |
- |
20 |
1 |
- |
120 |
85 |
110 |
90 |
115 |
- |
- |
- |
- |
H075 |
- |
40 |
80 |
- |
20 |
40 |
- |
20 |
160 |
75 |
100 |
80 |
105 |
- |
- |
- |
- |
R300 |
2 |
- |
20 |
1,0 |
- |
10 |
5 |
- |
120 |
- |
- |
- |
- |
300 |
Min. 260 |
5 |
8 |
R280 |
- |
20 |
40 |
- |
10 |
20 |
- |
10 |
120 |
- |
- |
- |
- |
280 |
Min. 240 |
- |
10 |
R260 |
- |
40 |
80 |
- |
20 |
40 |
- |
20 |
160 |
- |
- |
- |
- |
260 |
Min. 220 |
- |
12 |
H100 |
2 |
- |
10 |
0,5 |
- |
5 |
1 |
- |
120 |
100 |
- |
110 |
- |
- |
- |
- |
- |
R350 |
2 |
- |
10 |
1,0 |
- |
5 |
5 |
- |
120 |
- |
- |
- |
- |
350 |
Min. 320 |
3 |
5 |
(a) Annealed |

Metallurgical State |
Dimensions, mm |
Hardness |
UTS MPa |
YS, MPa |
Elongation | |||||
---|---|---|---|---|---|---|---|---|---|---|
Thickness |
Width |
HB |
HV |
A100 [%] |
A [%] | |||||
Max. |
Max. |
Min. |
Max. |
Min. |
Max. |
Min. | ||||
D |
50 |
180 |
Same as drawn |
|||||||
H035 (a) |
50 |
180 |
35 |
65 |
35 |
70 |
- |
- |
- |
- |
R200 (a) |
50 |
180 |
- |
- |
- |
- |
200 |
Max. 120 |
25 |
35 |
H065 |
10 |
150 |
65 |
95 |
70 |
100 |
- |
- |
- |
|
R240 |
10 |
150 |
- |
- |
- |
- |
240 |
Min. 160 |
- |
15 |
H080 |
5 |
100 |
80 |
115 |
85 |
120 |
- |
- |
- |
- |
R280 |
5 |
100 |
- |
- |
- |
- |
280 |
Min. 240 |
- |
8 |
(a) Annealed |
Mechanical properties of CuETP wire rod (diameter 8.0mm) used in electrical application
Material |
CuETP |
| ||
---|---|---|---|---|
Production technology |
- |
Contirod, Southwire, Continuus Properzi | ||
Chemical composition Cu + Ag |
[%wt] |
99,95 – 99,97 |
99,98 |
|
Content by weight of elements |
[ppm] |
150 |
25 |
|
Oxygen |
[ppm] |
150 - 400 |
160 - 200 |
|
UTS |
[MPa] |
220 – 240 |
220 |
|
Elongation A250 |
[%] |
40 – 45 |
45 – 50 |
|
Ductility |
[mm] |
0,2 |
0,05 |
|
Mechanical properties of CuETP, CuETP1 wire rod
Production technology |
YS |
UTS |
Elongation A250 |
---|---|---|---|
[MPa] |
[MPa] |
[%] | |
Contirod |
140,0 |
220,7 |
42,3 |
Tensile stress characteristic of CuETP wire rod (diameter 8.0mm) from Contirod technology
Tensile stress characteristic of CuETP wire rod (diameter 8.0mm) by Fujiwara
Tensile stress characteristic of Cu-ETP wires (diameter 0.5-8.0 mm) after drawing process
Tensile stress characteristic of Cu-ETP wires (diameter 0.5-8.0 mm) after drawing process
UTS/YS ratio vs strain of Cu-OFE wires (diameter 0,5-8.0 mm) after drawing process
Elongation A250 vs strain of Cu-ETP wires (diameter 0,5-8.0 mm) after drawing process
Tensile stress characteristic of Cu-ETP wires (diameter 0.5-8.0 mm) after drawing process -logarithmic system
Tensile stress characteristic of Cu-ETP wires (diameter 0.5-8.0 mm) after drawing process -logarithmic system
Elongation vs strain of ETP copper (Cu min = 99,97% mass) wires in drawn and annealed state
Ultimate tensile strength vs strain of ETP copper (Cu min = 99,97% mass) wires in drawn and annealed state
Elongation and ultimate tensile strength of ETP copper before and after annealing
ε [%] |
Before annealing |
After annealing | ||
---|---|---|---|---|
A [%] |
Rm [N/mm2] |
A [%] |
Rm [N/mm2] | |
0 |
39 |
235 |
39 |
233 |
47,97 |
4 |
322 |
40 |
239 |
71,64 |
2,5 |
414 |
38 |
245 |
91,66 |
2 |
464 |
38 |
253 |
Influence of grain size on tensile properties of ETP copper
Grain size [mm] |
UTS [MPa] |
0,5% Proof Stress [MPa] |
Reduction in area [%] |
---|---|---|---|
0,03 |
248 |
104 |
77 |
0,15 |
234 |
93 |
62 |
Vickers microhardness curve of the ETP copper wire after cold wire drawing [601]
Evolution of the Vickers microhardness of the ETP copper wire (after annealing at 260°C) as a function of holding time
Hardness HBW of ETP copper (applying Brinell Hardness tester with the ball of 2,5 mm and load of 625 N)
Microhardness of ETP copper in the present study and ETP copper
as
functions of N and corresponding equivalent strain, before and after normalization (diameter of wire 1mm).
Remark: The relation H vs wr depends on the crystal structure of the pure metals.
Dependence of the hardness at room temperature on the total specific heat capacity wr for ETP copper (Kgm/cm3=KG/mm2)
Influence of various additional elements on the elastic modulus of copper
Effect of homologous temperature on Young’s modulus E of ETP copper
The dependence Young’s modulus E versus specific heat capacity wr at room temperature
Effect of low temperatures on the mechanical properties of Cu-ETP
Metal and crystal structure |
Material condition |
Temperature [°C] |
Tensile strength /yield limit [Mpa] |
Elongation [%] |
Reduction of area [%] |
---|---|---|---|---|---|
Cu 99,90; K12 |
Bar 10mm, annealed at 800°C |
17 |
- |
29 |
70 |
-191 |
- |
41 |
72 |
||
-253 |
- |
48 |
48 |
Remarks: As can be seen from the table, ETP copper (FCC metal) preserve ductility at low temperatures.
Influence of temperature on the mechanical properties of annealed (600°C), forged ETP copper
Temperature [°C] |
Tensile Strength [MPa] |
Elongation [%] |
Reduction in area [%] |
---|---|---|---|
20 |
220,0 |
32 |
67-75 |
160 |
184,0 |
32 |
71 |
300 |
132,0 |
30 |
50 |
410 |
85,0 |
19 |
24 |
555 |
48,5 |
14 |
19 |
650 |
33,0 |
15 |
20 |
790 |
19,0 |
14 |
34 |
970 |
8,0 |
6 |
15 |
Mechanical properties of ETP copper as a function of temperature (-180°C to +600°C)
Temperature [°C] |
Tensile Strength [MPa] |
Elongation [%] |
Reduction in area [%] |
---|---|---|---|
-180 |
408 |
58 |
72 |
-120 |
288 |
45 |
70 |
-80 |
270 |
47 |
74 |
-40 |
236 |
47 |
77 |
-20 |
220 |
48 |
76 |
20* |
190 |
36 |
67 |
300 |
183 |
42 |
62 |
400 |
150 |
43 |
74 |
500 |
130 |
45 |
75 |
600 |
115 |
37 |
65 |
* Above zero temperature measurements were performed with wire speciments of 5mm diameter and 160mm length. |
Influence of impurity content on tensile properties of ETP copper annealed at 700°C, 30min.
Content [%] |
Tensile strength [MPa] |
Elongation [%] |
Reduction of area [%] | |
---|---|---|---|---|
0,016 O2 |
227 |
54 |
77 |
|
0,04 |
|
224 |
50 |
72 |
0,06 |
|
227 |
56 |
70 |
0,09 |
|
231 |
53 |
65 |
0,27 |
|
241 |
49 |
57 |
0,36 |
|
259 |
55 |
39 |
0,016 O2 |
0,053 As |
220 |
57 |
72 |
0,005 |
0,093 |
224 |
57 |
70 |
0,003 |
0,036 |
227 |
60 |
79 |
0,009 |
0,06 |
234 |
55 |
62 |
0,013 |
0,86 |
238 |
56 |
66 |
0,006 |
1,04 |
238 |
59 |
79 |
0,008 O2 |
0,0035 Sb |
220 |
63 |
75 |
0,013 |
0,021 |
224 |
63 |
74 |
0,005 |
0,046 |
224 |
60 |
72 |
0,015 |
0,042 |
234 |
49 |
73 |
0,016 |
0,22 |
231 |
67 |
77 |
0,014 |
0,47 |
234 |
58 |
66 |
0,015 O2 |
0,002 Bi |
224 |
66 |
68 |
0,016 |
0,006 |
231 |
62 |
72 |
0,015 |
0,015 |
231 |
64 |
72 |
0,014 O2 |
0,06 Fe |
227 |
57 |
73 |
0,003 |
0,20 |
224 |
60 |
73 |
0,004 |
0,40 |
234 |
60 |
80 |
0,008 |
0,73 |
262 |
52 |
80 |
0,005 |
0,96 |
252 |
45 |
82 |
0,004 |
1,32 |
301 |
30 |
79 |
0,007 |
1,80 |
311 |
29 |
79 |
Remarks: A stronger change in tensile strength and elongation was observed only for Fe addition with a content of more than one percent. For all impurities, with the exception of those mentioned above (>1%), tensile strength was 220 to 262 MPa and elongation was about 45 to 67%, which indicated good ductility properties.
Dependence of tensile strength of ETP copper on its homologous temperature Th
Mechanical properties vs temperature of Cu-ETP wire rod (diameter 8.0mm) after 1 hour annealing process (At temperatures from 100 °C to 400 °C the UTS of Cu-ETP wire rod is stable, while in the temperature range of 500 °C to 900 decreases)
Elongation A250 vs temperature of Cu-ETP wire rod (diameter 8.0mm) after 1 hour annealing process
Variation of tensile properties and grain size of electrolytic tough pitch copper (Cu-ETP) and similar coppers (Cu-ETP1)
Short-time elevated-temperature tensile properties of Cu-ETP (C11000) and similar coppers (Cu-ETP1)
Low-temperature tensile properties of Cu-ETP (C11000) and similar coppers (Cu-ETP1)
Remark: For ETP copper, as for pure aluminium (both FCC metals), the difference between the Rm and Re magnitudes is larger at low temperature than at room temperature, unlike the BCC metals Cr, Ta and V.
Effect of temperature on the tensile strength Rm and yield limit Re of Cu-ETP
Tension stress characteristic of Cu-ETP wires (diameter 0.5-8.0 mm) obtained from wire rod after annealing process
Tensile stress characteristic of Cu-ETP wires (diameter 0.5-8.0 mm) obtained from wire rod after annealing process
Elongation vs strain of Cu-ETP wires (diameter 0.5-8.0 mm) obtained from wire rod after annealing process
Remarks: The diagrams lack a physical yield point.
Compression diagrams at 20°C and -180°C of Cu-ETP ductile at low temperatures
Effect of elevated temperatures on the Knoop hardness HK of ETP copper
Temperature [°C] |
Knoop hardness HK [kg/mm2] |
---|---|
20 |
48 |
100 |
47 |
200 |
36 |
300 |
28,8 |
400 |
22,3 |
500 |
27,5 |
600 |
10 |
700 |
8 |
800 |
7,4 |
900 |
3,5 |
Softening resistance of Cu-ETP
Microhardness dependence on the annealing temperature for ETP copper samples subjected to ECAP with and without back pressure (BP)
Dependence of the Knoop hardness HK at 0°K (-273,15°C) on the total molar heat capacity W0 for ETP copper
Thermal expansion and enthalpy of Cu-ETP. (a) Total thermal expansion from -190 °C. (b) Enthalpy (heat content) above 0 °C
Thermal conductivity of Cu-ETP in different temperature
Temperature |
Thermal conductivity | |
---|---|---|
K |
°C |
W/m·K |
4.2 |
-268.8 |
300 |
20 |
-253 |
530 |
77 |
-196 |
550 |
194 |
-79 |
400 |
273 |
0 |
390 |
373 |
100 |
380 |
573 |
300 |
370 |
973 |
700 |
300 |
Effect of temperature on the thermal conductivity of ETP copper
Temperature |
Thermal conductivity | |
---|---|---|
K |
°C |
W/m·K |
100 |
-173,15 |
483 |
200 |
-73,15 |
413 |
300 |
26,85 |
398 |
400 |
126,85 |
392 |
600 |
326,85 |
383 |
800 |
526,85 |
371 |
1000 |
726,85 |
357 |
1200 |
926,85 |
342 |
1400 |
1126,85 |
167 |
1600 |
1326,85 |
174 |
Thermal conductivity measurements derived from the thermal diffusivity data for ETP copper
Differential Scanning Calorimetry (DSC) of ETP copper (Differential scanning calorimetry DSC measurements were carried out in order to find out the reason for the change in the TC slope at 200 °C – Fig. above)
Thermal conductivity of ETP copper vs temperature (temperature range -200 to +25°C and range +50 to +600 °C). Measurements were performed by two methods. First method was based on the axial stationary heat flow in the temperature interval -200 to +25°C, namely from thetemperature of liquid nitrogen to room temperature. Second applied method of measurements in the temperature range +50 to +600 °C, was based on indirect measurements at 50, 100, 200, 400 and 600°C, where thermal diffusivity on the nonlinear mathematical Cape-Lehman model was calculated, taking into account radiation losses, an atmosphere of protective gas-argon and the covering of samples with graphite on both sides
Comparison between the nominal thermal conductivity curve for ETP copper RRR 50 (solid line) and the control sample. In theinset four different runs are displayed, showing the reproducibility of our measurements and allowing a better determination of the peak temperature
Thermal conductivity of the ETP copper. The three lines display the thermal conductivity of copper for diferent levels of RRR in order to evaluate those of the copper within the samples
Effect of temperature on the electrical resistivity of ETP copper
Temperature |
Electrical resistivity, µΩcm | |
---|---|---|
K |
°C | |
100 |
-173,15 |
0,348 |
200 |
-73,15 |
1,046 |
300 |
26,85 |
1,725 |
400 |
126,85 |
2,402 |
600 |
326,85 |
3,792 |
800 |
526,85 |
5,262 |
1000 |
726,85 |
6,858 |
1200 |
926,85 |
8,626 |
1400 |
1126,85 |
21,01 |
1600 |
1326,85 |
23,42 |
Electrical resistivity of ETP copper at subsero temperatures
Temperature |
Electrical resistivity, µΩcm | |
---|---|---|
K |
°C | |
1 |
-272,15 |
0,002 |
20 |
-253,15 |
0,0028 |
40 |
-233,15 |
0,0239 |
60 |
-213,15 |
0,0971 |
80 |
-193,15 |
0,215 |
100 |
-173,15 |
0,348 |
150 |
-123,15 |
0,699 |
200 |
-73,15 |
1,046 |
273 |
-0,15 |
1,543 |
Softening resistance of cold drawn Cu-ETP wires
Softening resistance of cold drawn Cu-OFE wires
Effect of the content of different elements added to ETP copper on its recrystallization temperature
Content [%] |
Recrystallization temperature [°C] |
---|---|
0,24 Sn |
375 |
0,24 Ag |
340 |
0,19 Pb |
325 |
0,24 Mg |
320 |
0,36 P |
325 |
0,19 Cd |
300 |
0,06 Sb |
280 |
0,21 S |
275 |
0,14 As |
250 |
0,21 Ni |
250 |
0,20 Au |
250 |
0,06 Si |
245 |
0,33 Zn |
220 |
0,027 Bi |
200 |
0,21 Fe |
190 |
0,12 Al. |
150 |
Recrystallization temperature of ETP copper t = 205°C |
Remarks: The effect of foreign atoms on the recrystallization temperature is strongly connected with the type of foreign atoms. Inclusion of foreign atoms mostly increases the recrystallization temperature. In some rare cases (Al, Fe and Bi) impurities decrease the recrystallization temperature. The largest increase of this temperature was for 0,24% Sn (Δt=170°C).
Increase in the recrystallization temperature of ETP copper (205°C) by the addition of 0,01 atomic percent of the indicated element
Added element |
Increase in recrystallization temperature [°C] |
---|---|
Ni |
0 |
Co |
15 |
Fe |
15 |
Ag |
80 |
Sn |
180 |
Te |
240 |
Remarks: For Te and Se, the increase in the recrystallization temperature is very high.
Influence of temperature on Young’s modulus (E) of annealed ETP copper
Temperature [°C] |
Young's modulus [GPa] |
---|---|
-183 |
136 |
20 |
129 |
400 |
111 |
600 |
95,1 |
950 |
65 |
Relation between hardness and Young’s modulus of ETP copper at -200°C
Mechanical properties vs temperature of Cu-ETP wire rod (diameter 8.0mm) after 24 hours annealing process
Elongation A250 vs temperature of Cu-ETP wire rod (diameter 8.0mm) after 24 hours annealing process
Percentage reduction of area vs temperature of Cu-ETP wire rod (diameter 8.0mm) after 24 hours annealing process
Half-softening temperature of Cu-ETP wire
Diameter of wire | Strain | Half-softening temperature |
---|---|---|
[mm] | [-] | [°C] |
7,0 | 0,28 | 265 |
5,5 | 0,76 | 210 |
4,5 | 1,16 | 210 |
2,5 | 2,38 | 175 |
0,5 | 5,59 | 125 |
CuETP (C11000) is subjected to embrittlement when heated to 370 °C or above in a reducing atmosphere, as in annealing, brazing or welding. If hydrogen or carbon monoxide is present in the reducing atmosphere embrittlement can be rapid. Literature:
Type of corrosion |
Suitability |
Literature |
---|---|---|
Atmospheric |
Good |
|
Marine environment |
Good |
|
Stress crack |
Good |
|
Hydrogen embrittlement |
CuETP (C11000) is subjected to embrittlement when heated to 370 °C or above in a reducing atmosphere, as in annealing, brazing or welding. If hydrogen or carbon monoxide is present in the reducing atmosphere embrittlement can be rapid |
|
Electrolytic |
Good |
|
Other |
C11000 has excellent corrosion resistance to weathering and very good resistance to many chemicals. It is often used specifically for corrosion resistance. It is suitable for use with most waters, and can be used underground because it resists soil corrosion. It resists non-oxidising mineral and organic acids, caustic solutions and saline solutions. Depending on concentration and specific conditions of exposure, copper generally resists: acids mineral acids such as hydrochloric and sulphuric acids; organic acids such as acetic acid (including acetates and vinegar), carbolic, citric, formic, oxalic, tartaric and fatty acids; acidic solutions containing sulphur, such as the sulphurous acid and sulphite solutions used in pulp mills. Alkalies fused sodium and potassium hydroxide; concentrated and dilute caustic solutions. Salt solutions aluminium chloride, aluminium sulphate, calcium chloride, copper sulphate, sodium carbonate, sodium nitrate, sodium sulphate, zinc sulphate. Waters all potable waters, many industrial and mine waters, seawater and brackish water. The corrosion resistance of C11000 is not adequate for: ammonia, amines and ammonium salts; oxidizing acids such as chromic and nitric acids and their salts; ferric chloride; persulphates and perchlorates; mercury and mercury salts. Copper may also corrode in aerated non oxidising acids such as sulphuric and acetic acids, although it is practically immune from these acids if air is completely excluded. Copper is not suitable for use with acetylene, which can react to form an acetylide which is explosive. C11000 is considered to be immune to stress corrosion cracking in ammonia and the similar media which cause season cracking in brass and other copper alloys. |
|
www.copper.org
ETP copper corrosion in the formic and carboxylic acid
Two experiments were performed in which the relative humidity was kept constant during a major part of the exposure and only the formic acid concentration was varied. Three Cu-500 nm and three Cu-85 nm sensors were exposed to air at 80% and 60% RH, respectively, with increasing acid concentrations. It should be noted that due to the use of different permeation tubes with formic acid, the concentrations were slightly different in the two experiments. An example of the corrosion depth record for a Cu-500 nm sensor is plotted in Fig. below. The other records were similar. The experiment started in clean air at 15% RH. The corrosion rate was below the detection limit until the relative humidity was increased to 70%. The corrosion rate stabilized at about 0.01 nm/day after 4 days and did not change even though the relative humidity was increased to 80% RH. Formic acid did not have a dramatic effect on copper corrosion when present at concentrations from 10 to 220 ppb. When the formic acid concentration was increased to 460 ppb, the corrosion rate changed to 0.05 nm/day. It stayed at this level at 1000 ppb as well. An additional increase in the corrosion rate to 0.14 nm/day was recorded at the maximal formic acid concentration of 1590 ppb. The corrosion rate decreased gradually to low values when the formic acid concentration was lowered to 190, 80 and 0 ppb. Cu-85 nm sensors were used in a similar experiment with a lower maximal relative humidity of 60%. Corrosion rates extracted from stabilized parts of the corrosion depth vs. time records are given in Table below. Analogously to the previous experiment at 80% RH, the corrosion rate of copper only increased above about 0.01 nm/day when the concentration of formic acid was raised from 210 ppb to 420 ppb. Indeed, the increase was stronger under the wetter conditions. Whereas the corrosion rate continued to increase in more contaminated air at 80% RH, it remained nearly constant at 0.04 ± 0.01 nm/day at 60% RH until the formic acid concentration was raised to 2880 ppb .
Corrosion depth measured in air containing formic acid using a Cu-500 nm sensor; numbers give concentration of formic acid in ppb and relative humidity in per cent
Corrosion rate of ETP copper sensors after stabilization in the presence of formic acid
c(HCOOH), ppb |
Corrosion rate, vcorr, nm/day | |
---|---|---|
60% RH |
80% RH | |
0 |
0,014±0,003 |
0,010±0,005 |
30-60 |
0,013±0,003 |
0,013±0,002 |
80-100 |
0,013±0,002 |
0,009±0,003 |
210-220 |
0,015±0,003 |
0,012±0,001 |
420-460 |
0,050±0,014 |
0,053±0,003 |
1000-1180 |
0,047±0,011 |
0,051±0,002 |
1550-1590 |
0,034±0,005 |
0,143±0,002 |
2880 |
0,043±0,003 |
- |
Corrosion rates as a function of the relative humidity and carboxylic acid concentration; (a) copper and formic acid; experimental points:vcorr≤0,015 nm/day,0,015<vcorr≤0,06nm/day,vcorr>0,06 nm/day
Relaxation at stress level 0.5 × Yield Strength
Stress relaxation curves for Cu-ETP (C11000) and similar coppers (Cu-ETP1). Data are H80 temper wire, 2 mm in diameter, and represent the time-temperature combination necessary to produce a 5% reduction in tensile strength
Creep properties of CuETP, CuETP1 (C11000)
Temper |
Testing temperature |
Stress |
Duration of test |
Total extension(a) |
Intercept |
Minimum creep rate |
---|---|---|---|---|---|---|
°C |
MPa |
h |
% |
% |
% per 1000 h | |
Strip, 2.5mm thick | ||||||
OS030 |
130 |
55 |
2500 |
2.6 |
2.0 |
0.15 |
100 |
2600 |
10.0 |
7.6 |
1.2 |
||
140 |
170 |
29.8(b) |
- |
39 |
||
175 |
55 |
2000 |
3.3 |
2.3 |
0.65 |
|
100 |
350 |
15(b) |
8.0 |
6.3 |
||
H01 |
130 |
55 |
8250 |
0.20 |
0.15 |
0.01 |
100 |
8600 |
0.67 |
0.26 |
0.042 |
||
140 |
1750 |
2.4(b) |
0.32 |
0.45 |
||
175 |
55 |
6850 |
1.14 |
0.14 |
0.088 |
|
100 |
1100 |
2.0 |
0.22 |
0.66 |
||
H02 |
130 |
55 |
7200 |
0.24 |
0.13 |
0.01 |
100 |
8600 |
1.02 |
0.25 |
0.054 |
||
140 |
4680 |
3.4(b) |
0.36 |
0.27 |
||
175 |
55 |
1050 |
3.3(b) |
- |
0.6 |
|
H06 |
130 |
55 |
8250 |
1.58 |
0.08 |
0.035 |
100 |
8700 |
7.31 |
0.16 |
0.055 |
||
140 |
4030 |
11(b) |
0.24 |
0.17 |
||
Rod, 3.2 mm diameter | ||||||
OS025 |
260 |
2.5 |
6000 |
0.08 |
0.016 |
0.011 |
4.1 |
6000 |
0.19 |
0.010 |
0.030 |
||
7.2 |
6500 |
0.64 |
0.113 |
0.080 |
||
13.8 |
6500 |
2.88 |
0.87 |
0.306 |
||
H08 |
205 |
7.2 |
6500 |
0.06 |
0.045 |
0.011 |
14.5 |
6500 |
0.20 |
0.112 |
0.012 |
||
28 |
6500 |
1.08 |
0.41 |
0.097 |
||
50 |
6500 |
5.42 |
2.47 |
0.44 |
||
(a) Total extension is initial extension (not given in table) plus intercept plus the product of minimum creep rate and duration. (b) Rupture test |
||||||
Literature: |
Creep-rupture strength for ETP copper for 100 hours creep
Temperature, °C |
R100, MPa |
---|---|
650 |
90 |
730 |
40 |
810 |
22 |
Values given below apply to any of the unalloyed copper in contact with the indicated materials without lubrication of any kind between the contacting surfaces:
Opposing material |
Coefficient of friction | |
---|---|---|
Static |
Sliding | |
Carbon steel |
0.53 |
0.36 |
Cast iron |
1.05 |
0.29 |
Glass |
0.68 |
0.53 |
Literature: |
Temper |
Fatigue strength at 108 cycles in a reversed bending test , MPa |
---|---|
Flat products, 1 mm thick | |
OS025 |
76 |
H02 |
90 |
H04 |
90 |
H08 |
97 |
Rod, 25 mm in diameter | |
H80 (35%) |
115 (At 3 × 108 cycles in a rotating beam test) |
Literature: |
Values shown in table are typical for all tough pitch, oxygen-free, phosphorus-deoxidized and arsenical coppers. Copper does not exhibit an endurance limit under fatigue loading and, on the average, will fracture in fatigue at the stated number of cycles when subjected to an alternating stress equal to the corresponding fatigue strenght (see Fig.)
Rotating-beam fatigue strength of Cu-ETP (C11000) wire, 2 mm in diameter, H80 temper
The fatigue strength is defined as the maximum bending stress amplitude which a material withstands for 107 load cycles under symmetrical alternate load without breaking. It is dependent on the temper tested and is about 1/3 of the tensile strength .
Influence of impurity content on fatigue limit of ETP copper annealed at 700°C, 30min.
Content, % |
Fatigue limit, MPa | |
---|---|---|
0,016 O2 |
|
77 |
0,04 |
|
94 |
0,06 |
|
91 |
0,09 |
|
84 |
0,27 |
|
77 |
0,36 |
|
77 |
0,016 O2 |
0,053 As |
98 |
0,005 |
0,093 |
101 |
0,003 |
0,036 |
95 |
0,009 |
0,06 |
101 |
0,013 |
0,86 |
105 |
0,006 |
1,04 |
108 |
0,008 O2 |
0,0035 Sb |
84 |
0,013 |
0,021 |
91 |
0,005 |
0,046 |
91 |
0,015 |
0,042 |
91 |
0,016 |
0,22 |
108 |
0,014 |
0,47 |
122 |
0,015 O2 |
0,002 Bi |
94 |
0,016 |
0,006 |
94 |
0,015 |
0,015 |
105 |
0,014 O2 |
0,06 Fe |
98 |
0,003 |
0,20 |
94 |
0,004 |
0,40 |
10,1 |
0,008 |
0,73 |
10,1 |
0,005 |
0,96 |
10,5 |
0,004 |
1,32 |
10,8 |
0,007 |
1,80 |
11,2 |
Fatigue factor S/Rm of ETP copper in annealed condition versus the homologous temperature (T/Tmp = ratio of room temperature to melting point, in °K)
Remark: For FCC pure metals there exists a nearly common linear dependence of the fatigue limit on the tensile strength.
Fatigue limit versus tensile strength of recrystallized ETP copper
Remark: The fatigue limit depends on the tensile strength of the metal.
Fatigue limit Stc of ETP copper versus tensile strength Rm at different temperatures
Fatigue factor Stc/Rm of ETP copper at low temperatures
Dependence of fatigue limit σd and tensile strength Rm on the total heat capacity wr at room temperature for ETP copper
Summary table of fatigue limits of ETP copper at room temperature
Metal |
Type of material |
Corresponding mechanical properties in MPa and elongation, % |
Fatigue limit, MPa |
Basic number of cycles |
References |
Cu 99,98 |
Annealed at 700°C rod |
Rm=227 El. 57% Red of Area 72% |
Reversed Bending 70 |
5∙102 |
|
Cu 99,96 |
Annealed at 710°C/30min. |
Rm=203 El. 60% |
Reversed Bending 87 |
3∙107 |
|
Cu 99,96 HC (high conductivity) |
Annealed |
Rm=220 |
Reversed Bending 76,5 |
3∙107 |
|
Cu 99,92; 0,05 O2 (high conductivity) |
Annealed tape
Cold-rolled tap, cold-worked 20% |
Rm=228 |
Reversed Bending 77,1
Reversed Bending 91,3 |
108
108 |
|
Cu 0,016 O2 |
Annealed at 700°C/30min. |
Rm=227 El. 54% Red of Area 77% |
Reversed Bending 77,1 |
5∙107 |
|
Cu 0,17 O2 |
Rm=241 El. 49% Red of Area 57% |
Reversed Bending 77 |
5∙107 |
|
|
Cu 0,008 O2; 0,22 Sb |
Annealed 700°C/0,5h |
Rm=231 El. 67% Red of Area 77% |
Reversed Bending 108 |
2∙107 |
|
Cu 99,91 electrolytic; 0,032 Fe; 0,05 Zn |
Rolled and annealed |
Rm=244 Red of Area 95% |
Reversed Bending 108 Rotating Beam 74 |
2∙107 |
|
Typical impact strength of Cu-ETP (Cu-ETP1)
Product and condition | Impact strength, J |
---|---|
Charpy V-notch | |
Hot rolled, annealed | 96 |
Charpy keyhole-notch | |
As-cast | 11 |
As-hot rolled | 43 |
Rod
|
52 35 |
Izod | |
Rod
|
54 45 |
Plate
|
52 53(a) 39(b) |
Cold rolled 50% | 26(a) |
12(b) | |
(a) Parallel to rolling direction. (b) Transverse to rolling direction | |
Literature: |
Fabrication properties
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Value | Comments | |
Soldering | Excellent | ||
Brazing | Good | ||
Hot dip tinning | Excellent | ||
Electrolytic tinning | Excellent | ||
Electrolytic silvering | Excellent | ||
Electrolytic nickel coating | Excellent | ||
Laser welding | Less suitable | ||
Oxyacetylene Welding | Not Recommended | ||
Gas Shielded Arc Welding | Not Recommended | ||
Coated Metal Arc Welding | Not Recommended | ||
Resistance welding | Less suitable | ||
Spot Weld | Not Recommended | ||
Seam Weld | Not Recommended | ||
Butt Weld | Good | ||
Capacity for Being Hot Formed | Excellent | ||
Forgeability Rating | 65 | ||
Machinability Rating | 20 | Less suitable |
Technological properties
|
||||||||
Melting temperature [°C] | Casting temperature [°C] | Castability | Annealling temperature [°C] | Homogenization temperature [°C] | Quenching temperature [°C] | Ageing temperature [°C] | Stress relievieng temperature [°C] | Hot working temperature [°C] |
1083![]() | 1140-1200![]() | No data | 475-750![]() | No data | No data | No data | 150-200![]() | 750-875![]() |
Time - temperature relationships for annealing Cu-ETP and similar coppers (Cu-ETP1)
